HV CV Testing CS-600 Series
■ Resolution: down to 1 mV
■ Measurement Range: < 1 µF
■ Frequency Range: up to 1 MHz
■ Gate Bias: +/- 25V at 1 mV/step
■ Sweep Types: Linear / Log / List / Single
HV CV Testing CS-600 Series
High Voltage C-V Measurement System : CS-605A/CS-603A Capacitance measurement of devices for power electronics such as SiC, GaN, High-voltage capacitor & etc.
■ Automatic measurement on capacitances at 5kV(CS-605A)/3kV(CS-603A) with sweep
■ Test adaptors for curve tracer can be used for various device package types
■ System up with probe station for capacitance measurement on Wafer & on Chip
■ High and low temperature test in chamber with external interlock function
■Automatic measurement on capacitances at 5kV(CS-605A)/3kV(CS-603A) with sweep
■Test adaptors for curve tracer can be used for various device package types
■System up with probe station for capacitance measurement on Wafer & on Chip
■High and low temperature test in chamber with external interlock function
■ Automatic measurement on capacitances at 5kV(CS-605A)/3kV(CS-603A) with sweep
■ Test adaptors for curve tracer can be used for various device package types
■ System up with probe station for capacitance measurement on Wafer & on Chip
■ High and low temperature test in chamber with external interlock function